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도서명 반도체의 부가가치를 올리는 패키지와 테스트
저자 서민석
출판사 (주도서출판한올출판
출판일 2020-03-10
정가 22,800원
ISBN 9791156858577
수량
01 반도체 테스트의 이해

01.? 반도체 후공정 ······················································ 5
02.? 테스트의 종류······················································ 8
03.? 웨이퍼 테스트 ···················································· 10
EPM ································································ 13
웨이퍼 번인······················································· 13
테스트 ····························································· 14
리페어······························································ 15
04.? 패키지 테스트 ···················································· 16
TDBI································································ 17
테스트 ····························································· 18
외관 검사·························································· 18

02 반도체 패키지의 정의와 역할

01.? 반도체 패키지의 정의········································· 25
02.? 반도체 패키지의 역할 ········································ 26
03.? 반도체 패키지의 개발 트렌드····························· 28
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